Investigation of Tibetian Plateau varnish: new findings at the nanoscale using focused ion beam and transmission electron microscopy techniques.
نویسندگان
چکیده
Dual-beam focused ion beam microscopy (FIB/SEM) preparation of rock varnish for high-resolution transmission electron microscopy (HR-TEM) has enabled us to characterize unreported nanostructures. Fossils, unreported textures, and compositional variability were observed at the nanoscale. These techniques could provide a method for studying ancient terrestrial and extra-terrestrial environments to better understand geological processes at the nanoscale.
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عنوان ژورنال:
- Scanning
دوره 33 2 شماره
صفحات -
تاریخ انتشار 2011